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| Biography: | Lalitha Dabbiru is a Research Associate II of the Geosystems Research Institute (GRI) at Mississippi State University. Her research interests include synthetic aperture radar (SAR) and remotely sensed image analysis. Her research activities also focused on small satellite engineering and knowledge management systems. Her past work experience include fabrication and integration of multi sensor chips. She received the M.S degree in Electrical Engineering, and currently pursuing the Ph.D. degree in Electrical Engineering at Mississippi State University. She is a member of the IEEE.
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| Research Interest: | Synthetic Aperture Radar (SAR), Remote Sensing, Image Analysis
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| Publications: | Luo, Y., Feng, X., Houser, P., Anantharaj, V., Fan, X., Lannoy, G. D., Zhan, X., & Dabbiru, L. (2013). Potential Soil Moisture Products from the Aquarius Radiometer and Scatterometer Using an Observing System Simulation Experiment. Geoscientific Instrumentation, Methods and Data Systems. Copernicus Publications. 2, 113 - 120. DOI:10.5194/gi-2-113-2013. [Abstract] [Document] [Document Site]
Aanstoos, J.V., Hasan, K., O\'Hara C., Dabbiru, L., Mahrooghy, M., Nobrega, R. A. A., & Lee, M. (2012). Detection of Slump Slides on Earthen Levees Using Polarimetric SAR Imagery. 2012 IEEE Applied Imagery Pattern Recognition Workshop. Washington, DC: IEEE. [Abstract] [Document]
Dabbiru, L., Aanstoos, J.V., Mahrooghy, M., Li, W., & Younan, N. H. (2012). Levee Anomaly Detection Using Polarmetric Synthetic Aperture Radar Data. IGARSS 2012. Munich, Germany: IEEE. [Abstract] [Document]
Dabbiru, L., Aanstoos, J.V., Hasan, K., Mahrooghy, M., Nobrega, R. A. A., Gokaraju, B., & Younan, N. H. (2011). Characterizing Levees Using Polarimetric and Interferometric Synthetic Aperture Radar Imagery. AGU Fall Meeting 2011. San Francisco, CA, USA. [Abstract] [Document]
Aanstoos, J.V., Hasan, K., O\'Hara C., Prasad, S., Dabbiru, L., Mahrooghy, M., Gokaraju, B., Lee, M., & Nobrega, R. A. A. (2011). Earthen Levee Monitoring with Synthetic Aperture Radar. Proc. IEEE Applied Imagery Pattern Recognition Workshop. Washington, DC: IEEE. [Abstract] [Document]
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| Total Publications by this Author: 16 |
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